mark@mips.UUCP (Mark G. Johnson) (09/25/87)
In article <1309@leo.UUCP>, larry@leo.UUCP (Larry Johnson) writes > I am in the process of designing a DRAM for a chip set and > need to determine the soft error rate. The data I can't seem > to get my hands on is the alpha particle flux rate caused by > the package lid and the metal traces on the wafer. > Does anyone out there have typical numbers for this, and does > anyone have any good reference papers they could recommend. > Better still, did any of you write a paper on SER? The best single source is the proceedings of the IEEE International Electron Devices Meetings ("IEDM"). I strongly recommend this paper: Dennis Segers et al., "Circuit Design Methodologies for the Reduction of Alpha Soft Error Rate", IEDM Technical Digest, December 1983, pp. 331-5. as it covers design and test issues for modern (i.e. VCC/2 bitline) dRAMs. -- -Mark Johnson *** DISCLAIMER: The opinions above are personal. *** UUCP: {decvax,ucbvax,ihnp4}!decwrl!mips!mark TEL: 408-720-1700 x208 US mail: MIPS Computer Systems, 930 E. Arques, Sunnyvale, CA 94086