veit@du9ds3.uni-duisburg.de (Holger Veit) (03/22/91)
REQUEST FOR DISCUSSION - please respond
NAME:
comp.lsi.cat
STATUS:
unmoderated
CHARTER:
"A major problem, one which is growing in importance, is testing.
Problems associated with testing of digital logic have been with
us for as long as digital logic itself has existed." [Alexander
Miczo, Digital Logic and Simulation, 1986]
During the last 25 years, an immense number of techniques,
methods and algorithms to guarantee the proper testing of
electronic devices have been introduced. Testing is an important
subject to many major international conferences (e.g. ITC, ETC,
DAC, EDAC, ICCD, ICCAD, FTCS, ISCAS) and journals (e.g. JETTA,
IEEE Trans. on CAD, IEEE Trans. on Comp.). Thus, testing is
an area of highest relevance to many CAD researchers and
professionals.
This newsgroup is intended to cover all aspects of the testing of
electronic circuits such as (but not restricted to)
* Testing of Digital and Analog Devices
* Automatic Test Pattern Generation
* Fault Modeling and Fault Simulation
* Design for Testability
* Scan Design and Built-in Self Test
* PCB-Test and Boundary Scan
* Design Verification
Important topics are
* Announcements (conferences, workshops, special issues)
* Books on testing
* Standards
* Tools
* Benchmarks
* Questions and answers
* Discussions concerning technical or algorithmic problems
WHY A NEW GROUP:
The ever increasing number of publications on testing shows a
vivid and growing interest in that subject. A newsgroup on
testing will stimulate and accelerate the exchange of related
information among interested network users. It makes it easier
to recognize current trends in testing, especially
for novices. We believe that there will be enough traffic in
the new group to justify its creation.
SCHEDULE:
1. DISCUSSION
The discussion period begins on monday, march 25.
It ends on tuesday, april 23.
(possibly continued by email)
2. VOTE
If the discussion is successful, we will send the call for votes
on monday, april 29. This posting will contain all necessary
information how to vote. The rest of the procedure will follow
the rules to create new groups (see news.announce.newusers for details).
Please respect that the follow-up of a CALL FOR DISUSSION is news.groups.
Send your opinions to this call - otherwise there will be no comp.lsi.cat.
All comments are welcome.
Authors:
Nikolaus Gouders (gouders@du9ds3.uni-duisburg.de)
Holger Veit (veit@du9ds3.uni-duisburg.de)
--
| | / Holger Veit | INTERNET: veit@du9ds3.uni-duisburg.de
|__| / University of Duisburg | BITNET: veit%du9ds3.uni-duisburg.de@UNIDO
| | / Fac. of Electr. Eng. | UUCP: ...!uunet!unido!unidui!hl351ge
| |/ Dept. f. Dataprocessing |