[sci.nanotech] Reliability of nanocomputers

merkle@parc.xerox.com (Ralph Merkle) (05/04/91)

The error rate of 10^-12 for Drexler's rod logic was simply
the design objective.  Simple design changes could be used
to achieve dramatically lower error rates.

The simplest method of reducing the error rate is to
make the parts twice as big.  This results in stiffer
parts (stiffness scales with length.  Double the size,
double the stiffness) hence smaller positional errors.
Because positional errors caused by thermal noise are
described by a gaussian distribution, doubling the
size will result in a dramatic reduction in error rates.
Instead of 10^-12, we'd get (much) better than 10^-24.

Reducing the temperature will also result in dramatic
reductions in error rates.  Operating at liquid nitrogen
temperatures (77 Kelvins) would reduce thermal noise by
almost a factor of 4, which would result in error rates
much less than 10^-40.

By selectively changing certain "critical" lengths, the
overall reliability could be dramatically improved with
only modest impact on performance.

Finally, Drexler's design called for a 16 input 16 output
logic element.  Reliability was limited by the distance along
the linear rod between the most distant input and output.  By
reducing the number of inputs and outputs, hence reducing rod
length, the total "stretch" of the rod can be substantially
reduced with no other design changes at all.  Again, this
would produce a dramatic decrease in the error rate.  Thus,
by reducing fan-in and fan-out, we can get higher reliability.

Error rates are design parameters, and can be traded off against
other design parameters.  Increasing the error rate of the
logic elements leads to faster and less complicated designs for
the logic elements, but increases the complexity of the system
because system-level error handling must be made more robust.
Decreasing the error rate of the logic elements makes them slower
and perhaps more complex, but simplifies the system-level
error handling requirements.

The basic design of rod logic is simple and robust, so
specific implementations can be selected to lie almost anywhere
along the spectrum of reliability that we find interesting.

piety@hplred.hpl.hp.com (Bob Piety) (05/14/91)

/ merkle@parc.xerox.com (Ralph Merkle) / 11:42 am  May  3, 1991 /

> parts (stiffness scales with length.  Double the size,
                                        ^^^^^^
> double the stiffness) hence smaller positional errors.
> Because positional errors caused by thermal noise are
> described by a gaussian distribution, doubling the
> size will result in a dramatic reduction in error rates.
> Instead of 10^-12, we'd get (much) better than 10^-24.
             ^^^^^^                              ^^^^^^

> temperatures (77 Kelvins) would reduce thermal noise by
> almost a factor of 4, which would result in error rates
           ^^^^^^^^^^^
> much less than 10^-40.
                 ^^^^^^

I don't understand your mathematics-- please explain how you arrive at
these figures.

Thanks,

Bob          piety@hplred.hpl.hp.com      (415)857-4759

[In Drexler's paper "Rod Logic and Thermal Noise..." the 
 probability of error (after three pages of calculus) comes 
 out in the form 
      2 exp [1/2 (sigma  phi/kT)^2 -D phi/kT]

 Where phi is alignment force (a design constant), D is minimum 
 displacement for error (ditto), and sigma is std. dev. of knob
 displacement, a function of T whose leading term is linear in kT
 (k is Boltzmann's constant).  Thus the first term in the
 exponential is second-order; ignoring it, if we drop the 
 temperature by a factor of 2 we divide the probability of 
 error by exp(D phi) (which can be arbitrarily large, 
 depending on the design).
 The whole paper can be found in Molecular Electronic Devices III
 (1988, Elsevier).
 --JoSH]