MCDOWELL@kcgl1.eng.ohio-state.edu (James K. McDowell) (08/10/90)
AN UPDATE ON THE IEEE EXPERT SPECIAL TRACK.
KNOWLEDGE-BASED DIAGNOSIS FOR PROCESS ENGINEERING.
Several parties that have expressed an interest in submitting work for
consideration, have also noted concern about the deadline (proximity to other
AI and engineering events). In an effort to increase the quality and quantity
of submissions considered for the IEEE EXPERT Special Track of articles on
Knowledge-based Diagnosis for Process Engineering, the Guest Editorial Staff
is extending the deadline to FRIDAY, SEPTEMBER 14, 1990. The call for papers
appears below:
CALL FOR PAPERS. IEEE EXPERT SPECIAL TRACK.
KNOWLEDGE-BASED DIAGNOSIS FOR PROCESS ENGINEERING.
The goal of this series of articles is to identify state of the art
efforts in knowledge-based diagnosis for process engineering and explore the
requirements for real-world applications. The domain of interest is any
operation that involves the fabrication or production of materials by physical
or chemical processes. This could include, but is not limited to, process
industries (petroleum, chemical, food and pharmaceutical) as well as
manufacturing. The focus of this series is to bring together efforts in both
industry and academics for exploring the role of problem solving in the
development and deployment of real world diagnostic knowledge-based systems.
Because of wide variation in levels of understanding of the subject processes
and diverse sources of knowledge, diagnosis in process engineering affords
many opportunities for knowledge-based systems.
Diagnosis for process engineering can be thought to include the
following activities: monitoring, fault detection, malfunction diagnosis,
and corrective action planning. Monitoring activities concentrate on the
intelligent tracking of process variables and knowlege-based explanation of
normal process behavior. The detection task involves differentiation of
normal and abnormal conditions. The activity of malfunction diagnosis itself
involves the isolation of process malfunctions. Corrective action planning
takes a diagnostic conclusion and constructs a plan of action to deal with the
problem safely and economically.
Work involving fielded systems, novel approaches to diagnosis, real-time
and/or on-line applications, new shells for development of diagnostic systems
and user interface issues are encouraged to participate.
GUEST EDITORIAL STAFF
The Guest Editorial Staff for the IEEE EXPERT special track on
Knowledge-based Diagnosis for Process Engineering includes: James K. McDowell,
Department of Chemical Engineering and Laboratory for AI Research, Ohio State
University (Guest Editor); Mark A. Kramer, Department of Chemical Engineering
and Associate Director of the Laboratory for Intelligent Systems Process
Engineering, Massachusetts Institute of Technology (Guest Associate Editor);
and James F. Davis, Department of Chemical Engineering and Laboratory for AI
Research, Ohio State University (Guest Associate Editor).
SUBMISSION GUIDELINES
Manuscripts should follow the IEEE EXPERT submission guidelines:
approx. 5000 words, essential figures and references. Authors should submit
six (6) copies of their original papers to the address shown below.
Deadline for submission is FRIDAY SEPTEMBER 14, 1990.
SUBMISSION ADDRESS
James K. McDowell
Department of Chemical Engineering
and Laboratory for AI Research
The Ohio State University
140 West Nineteenth Ave.
Columbus, Ohio 43210
Phone: (614) 292-4944
email: mcdowell@kcgl1.eng.ohio-state.edu