jkp@tc.fluke.com (Jim Peckol) (02/21/90)
I have been asked to chair a session on the application of AI and Expert Systems to Manufacturing and Test. The session will be a part of the program at the Test Engineering Conference (formerly ATE & Instrumentation East). The conference, to be held in Boston on 5-7 June 1990, is sponsered by MG Expositions Group, a division of Miller Freeman Publications. The conference addresses the broad areas of test, instrumentation, and measurement electronics. I am issuing a call for papers for the above session. Papers are requested for but are not limited to the following topics: Expert Systems for diagnosis Expert systems for test strategy generation Expert Systems used for training Expert Systems in field service AI techniques applied to built in self test development AI techniques applied to VLSI design and test AI techniques for improving manufacturing processes Automatic test program generation Iconic or graphic programming Neural net applications to manufacturing and test I would like to have abstracts by 9 March with full papers by 6 April. You may respond by email to: jkp@fluke.COM or by surface mail to: Dr. Jim Peckol Sr. Staff Engineer John Fluke Mfg. Co. P.O. Box 9090 MS 241 Everett, Wa. 98206 (206) 356-5287 Thank you very much for your interest.