ian@ponder.csci.unt.edu (Ian Parberry) (02/21/91)
The following technical report is now available from CRPDC: P. Berman, I. Parberry, and G. Schnitger, ``A Note on the Complexity of Reliability in Neural Networks'', Technical Report CRPDC-91-3, Center for Research in Parallel and Distributed Computing, Dept. of Computer Sciences, University of North Texas, Feb. 1991. ABSTRACT: It is shown that in a standard discrete neural network model with small fan-in, tolerance to random malicious faults can be achieved with a log-linear increase in the number of neurons and a constant factor increase in parallel time, provided fan-in can increase arbitrarily. A similar result is obtained for a nonstandard but closely related model with no restriction on fan-in. Write to: Technical Reports Librarian Dept, of Computer Sciences University of North Texas P.O. Box 13886 Denton, TX 76203-3886 (Mike Carter, if you are reading this, I seem to have lost your address in my move to Texas. If you email it to me at ian@csci.unt.edu, I will send you a copy as promised). ____ Ian Parberry ian@dept.csci.unt.edu Dept. of Computer Science, Univ. of North Texas, P.O. Box 13886, Denton, TX 76203-3886 "Bureaucracy is expanding to meet the needs of an expanding bureaucracy"