leff@CSVAX.SEAS.SMU.EDU (Laurence Leff) (07/16/90)
Technical Report 90-21 is now available in the MCNC Library (bonnie@mcnc or 248-1853). It is entitled "Oxygen Ion Defect Generation in Gate Insulators of Insulated Gate Field-Effect Transistors and X-radiation Susceptibility of These Ion Damage Gate Insulators" by C.T. Sune, A. Reisman, and C.K. Williams.