leff@CSVAX.SEAS.SMU.EDU (Laurence Leff) (07/17/90)
MCNC has the following Technical Reports available: TR90-25 "Further Comments on the Thermal Etching of Silicon [The Surface Morphology of (100), (111), & (110) Wafers in the Temperature Range 900-1150C]" by A. Reisman, D. Temple, P. L. Smith TR90-26 "The Susceptibility of Sicion-Ion-Implanted Gate Insulators to X-ray Radiation-Induced Defect Generation" by C. T. Sune, A. Reisman, C. K. Williams TR90-27 "Conservation & Filling of Neutral Hole Traps in SiO2 during Ionizing Radiation Exposure" by L. Lipkin, A. Reisman, C. K. Williams TR90-28 "Challenges & Priorities For Two-Dimensional Process Simulation" by R. B. Fair TR90-29 "Modeling the Enhanced Diffusion of Implanted Boron in Silicon" by Yudong Kim, Teh Y. Tan, Hisham Z. Massoud, R. B. Fair TR90-30 "Physical Modeling of the Time Constraint of Transient Enhancement in the Diffusion of Ion-Implanted Dopants in Silicon" by Yudong Kim, Hisham Z. Massoud, Ulrich M. Gosele, Richard B. Fair TR90-31 "A VHDL Parser in Prolog" by Peter B. Reintjes TR90-32 "Built-In Self-Test with Weighted Random Pattern Hardware" by Franc Brglez, Clay Gloster, Gershon Kedem TR90-33 "A Technique for Preparing 'Two In One' Cross- Sectional TEM Specimens" by Guang-Hwa Ma, Sopa Chevacharoenkul TR90-34 "Efficient AC Analysis in CAzM" by Donald J. Erdman, Steve Kenkel, Gary Nifong TR90-35 "Modeling the Enhanced Diffusion of Implanted Boron in Silicon" by Yudong Kim, Teh Y. Tan, Hisham Z. Massoud, Richard B. Fair For a copy of any MCNC Technical Report, please contact the MCNC library at 919/248-1983; PO Box 12889, RTP, NC 27709 or send mail to Marti Moser, marti@mcnc.org.