mhs@ht.ai.mit.EDU (Mark Shirley) (03/17/88)
Does anyone out there have any references or information on applications of AI techniques to Testability in VLSI design? Thanks in advance, Gabriel. AI and Design for Testability: @InProceedings(shirley87, Key="shirley87", Author="Shirley, M., P. Wu, R. Davis, G. Robinson", Title="A Synergistic Combination of Test Generation and Design for Testability", Organization="The Computer Society of the IEEE", BookTitle="International Testing Conference 1987 Proceedings", Year="1987", Pages="701-711") In the last couple of years, the testing conference has had AI sessions \bibitem{abadir85} Magdy~S. Abadir and Melvin~A. Breuer. \newblock A Knowledge-Based System for Designing Testable VLSI Chips. \newblock {\it IEEE Design \& Test of Computers}, 56--68, August 1985. AI and Test Generation: @InProceedings(Shirley86, key="Shirley86", Author="Shirley, M.", Title="Generating Tests by Exploiting Designed Behavior", Organization=AAAI, BookTitle="Proceedings of the Fifth National Conference on Artificial Intelligence (AAAI-86)", Year=1986, Month=August, Pages="884-890") @InProceedings(Singh86, key="Singh86", Author="Singh, N.", Title="Saturn: An Automatic Test Generation System for Digital Circuits", Organization=AAAI, BookTitle="Proceedings of the Fifth National Conference on Artificial Intelligence (AAAI-86)", Year=1986, Month=August, Pages="778-783") Related DFT and Test Generation work: \bibitem{horstmann} Paul~W. Horstmann. \newblock Design for Testability using Logic Programming. \newblock In {\it Proceedings of 1983 International Test Conference}, pages~706--713, 1983. @PhDThesis(Lai81, Key="Lai", Author="Lai, Kwok-Woon", FullAuthor="Larry Kwok-Woon Lai", Title="Functional Testing of Digital Systems", School=CMU, Number="CMU-CS-148", Month="December", Year="1981") \bibitem{williams73} M.~J.~Y. Williams et al. \newblock Enhancing testability of large-scale integrated circuits via test points and additional logic. \newblock {\it IEEE trans on Computers}, C-22(1):46--60, January 1973.