[ont.events] ICR June 15 Dr Eichelberger Future Technology Test Problems & Self Test

cfry@watdcsu.waterloo.edu (C.Fry - Inst. Computer Research) (06/13/88)

                    Future Technology Test Problems and Self Test

          by

          Dr. E.B. Eichelberger

          IBM Fellow
          Advanced VLSI Technology and Testing
          IBM, Kingston, N.Y.

          Abstract

          Trends in VLSI testing will be discussed along  with  design  and
          test  results for three different VLSI microprocessors.  Expected
          future test problems based on this data will be  described.   One
          possible  solution,  random  pattern self test, will be discussed
          along with possible methods of achieving  high  stuck-fault  test
          coverage.

          DATE:     Wednesday, June 15, 1988

          TIME:     3:30 p.m.

          PLACE:    University of Waterloo, Davis Centre Room 1302

          Everyone is welcome.  Refreshments served.