jkp@tc.fluke.com (Jim Peckol) (02/21/90)
I have been asked to chair a session on the application of AI and Expert
Systems to Manufacturing and Test. The session will be a part of the program
at the Test Engineering Conference (formerly ATE & Instrumentation East).
The conference, to be held in Boston on 5-7 June 1990, is sponsered by MG
Expositions Group, a division of Miller Freeman Publications. The conference
addresses the broad areas of test, instrumentation, and measurement
electronics.
I am issuing a call for papers for the above session. Papers are requested
for but are not limited to the following topics:
Expert Systems for diagnosis
Expert systems for test strategy generation
Expert Systems used for training
Expert Systems in field service
AI techniques applied to built in self test development
AI techniques applied to VLSI design and test
AI techniques for improving manufacturing processes
Automatic test program generation
Iconic or graphic programming
Neural net applications to manufacturing and test
I would like to have abstracts by 9 March with full papers by 6 April.
You may respond by email to: jkp@fluke.COM
or by surface mail to: Dr. Jim Peckol
Sr. Staff Engineer
John Fluke Mfg. Co.
P.O. Box 9090 MS 241
Everett, Wa.
98206
(206) 356-5287
Thank you very much for your interest.