csd1453@ux.acs.umn.edu (csd1453) (11/07/90)
I would be grateful for some leads on the methodologies for integrating "shallow knowledge" (such as expert heuristics) and "deep knowledge" (such as parametric relationships) in the context of fault diagnosis in manufacturing processes. Specifically, I am interested in methods for combining acquired expert knowledge and results from simulation experiments to construct such diagnostic models. Any leads will be much appreciated. Thanks, Sanjay Chatterjee Information and Decision Sciences University of Minnesota sanjay@ux.acs.umn.edu ______________________