dyer@ajpo.sei.cmu.edu (Richard Dye) (02/22/91)
I am interested in references to any articles that would help me predict the error density in fielded software. Has anyone done any work or published any papers that describe the defect discovery and fix curves over time? Please forward to me and I will summarize for the net if there is any interest. Dick Dye Dick Dye CTA, Inc. M/S N8910 National Test Bed Falcon AFB, CO 80912-5000 (719) 380-2578 FAX: (719) 380-3100 (Put M/S N8910 on the first page) dyer@ajpo.sei.cmu.edu
mlo@cherry14.cray.com (Mick Oyer) (02/27/91)
In article <759@ajpo.sei.cmu.edu>, dyer@ajpo.sei.cmu.edu (Richard Dye) writes: |> |> I am interested in references to any articles that would help me |> predict the error density in fielded software. Has anyone done any |> work or published any papers that describe the defect discovery and |> fix curves over time? I'm involved in doing some of this type of work here at Cray. One or two items of interest: There's an article in Business Week, 2/11/91 that talks about Japanese vs. American Fault Density. According to the article, the Japanese are producing 12,447 lines of debugged source code per man-year, with an error density of 1.96 "technical failures per 1000 lines of source code". Us lowly Americans are producing code at a density of 4.44 TF/Kline of code. at a rate of 7,290 lines of code per man-year. I especially like the last sentence of the article - "Luckily, U.S. software experts have been monitoring developments in Japan for years and still have time to learn some Japanese tricks before it's too late". Where have I heard that before? This article is written in conjunction with a new book on the shelves: "Japan's Software Factories" by Michael A. Cusumano, Associate Professor of Mgmt. at MIT. Looks like interesting reading. I've got one on order, hopefully it will answer my question - "Where do some of these numbers come from?" | Michael (Mick) Oyer MAIL : mlo@cray.com || uunet!cray!mlo | | Sr. Software Analyst AT&T : work: (612)-683-5855 | | Cray Research, Inc. USNAIL : 655F Lone Oak Dr., Eagan, MN 55120 | -- | Michael (Mick) Oyer MAIL : mlo@cray.com || uunet!cray!mlo | | Sr. Software Analyst AT&T : work: (612)-683-5855 | | Cray Research, Inc. USNAIL : 655F Lone Oak Dr., Eagan, MN 55120 |