mauney@ncsu.UUCP (Jon Mauney) (02/11/86)
%A Amrit L. Goel %A Farokh B. Bastani %T Foreword: software reliability %J IEEE-TSE %V SE-11 %N 12 %P 1409-1410 %D DEC 1985 %X foreword to special issue on software reliability, part 1 %A Amrit L. Goel %T Software reliability models: assumptions, limitations, and applicability %J IEEE-TSE %V SE-11 %N 12 %P 1411-1423 %D DEC 1985 %K estimation, failure count models, fault seeding, input domain models, model fitting, NHPP, software reliability, times between failures %A Kazuhira Okumoto %T A statistical method for software quality control %J IEEE-TSE %V SE-11 %N 12 %P 1424-1430 %D DEC 1985 %K additional software test time, logarithmic Poisson model, software reliability model, software quality control %A Shigeru Yamada %A Shunji Osaki %T Software reliability growth modeling: models and applications %J IEEE-TSE %V SE-11 %N 12 %P 1431-1437 %D DEC 1985 %K error detection rate per error, maximum-likelihood estimation, nonhomogeneous Poisson processes, software error, software reliability analysis software reliability growth models %A Ravishankar K Iyer %A David J. Rossetti %T Effect of system workload on operating system reliability: a study on IBM 3081 %J IEEE-TSE %V SE-11 %N 12 %P 1438-1448 %D DEC 1985 %K failure analysis, software reliability, system workload, VM/SP %A Jospeh P. Cavano %T Toward high confidence software %J IEEE-TSE %V SE-11 %N 12 %P 1449-1455 %D DEC 1985 %K DOD applications, high confidence software, software reliability measurement methodology %A Nozer D. Singpurwalla %A Refik Soyer %T Assessing (software) reliability growth using a random coefficient autoregressive process and its ramifications %J IEEE-TSE %V SE-11 %N 12 %P 1456-1464 %D DEC 1985 %K dynamic linear and nonlinear models, Kalman filtering, likelihood ratios, predictive distributions, prequential analysis, random coefficient autoregressive processes, reliability growth, software reliability %A William S. Jewell %T Bayesiam extensions to a basic model of software reliability %J IEEE-TSE %V SE-11 %N 12 %P 1465-1471 %D DEC 1985 %K Bayesian analysis, program testing, software reliability %A Sheldon M. Ross %T Software reliability: the stopping rule problem %J IEEE-TSE %V SE-11 %N 12 %P 1472-1476 %D DEC 1985 %K Failure rates, software reliability, stopping times %A Debra J. Richardson %A Lori A. Clarke %T Partition analysis: a method combining testing and verification %J IEEE-TSE %V SE-11 %N 12 %P 1477-1490 %D DEC 1985 %K software testing, software verification, symbolic evaluation %A Algirdas Avizienis %T The N-version approach to fault-tolerant software %J IEEE-TSE %V SE-11 %N 12 %P 1491-1501 %D DEC 1985 %K design diversity, fault tolerance, multiple computation, N-version programming, N-version software, software reliability, tolerance of design faults %A Tom Anderson %A Peter A. Barrett %A Dave N. Halliwell %A Michael R. Moulding %T Software fault tolerance: an evaluation %J IEEE-TSE %V SE-11 %N 12 %P 1502-1510 %D DEC 1985 %K real-time systems, software fault tolerance, software reliability %A Dave E. Eckhardt %A Larry D. Lee %T A theoretical basis for the analysis of multiversion software subject to coincident errors %J IEEE-TSE %V SE-11 %N 12 %P 1511-1517 %D DEC 1985 %K coincident errors, fault-tolerant software, intensity distribution, intensity of coincident errors, multiversion software, N-version programming, reliability of redundant software -- Jon Mauney, mcnc!ncsu!mauney North Carolina State University