[net.mag] TOC: IEEE Trans on Software Engineering, Dec 1985

mauney@ncsu.UUCP (Jon Mauney) (02/11/86)

%A Amrit L. Goel
%A Farokh B. Bastani
%T Foreword: software reliability
%J IEEE-TSE
%V SE-11
%N 12
%P 1409-1410
%D DEC 1985
%X foreword to special issue on software reliability, part 1

%A Amrit L. Goel
%T Software reliability models: assumptions, limitations, and applicability
%J IEEE-TSE
%V SE-11
%N 12
%P 1411-1423 
%D DEC 1985
%K estimation, failure count models, fault seeding, input domain models,
model fitting, NHPP, software reliability, times between failures 

%A Kazuhira Okumoto
%T A statistical method for software quality control
%J IEEE-TSE
%V SE-11
%N 12
%P 1424-1430 
%D DEC 1985
%K additional software test time, logarithmic Poisson model,
software reliability model, software quality control 

%A Shigeru Yamada
%A Shunji Osaki
%T Software reliability growth modeling: models and applications
%J IEEE-TSE
%V SE-11
%N 12
%P 1431-1437 
%D DEC 1985
%K error detection rate per error, maximum-likelihood estimation,
nonhomogeneous Poisson processes, software error, software reliability analysis 
software reliability growth models 

%A Ravishankar K Iyer
%A David J. Rossetti
%T Effect of system workload on operating system reliability:
a study on IBM 3081 
%J IEEE-TSE
%V SE-11
%N 12
%P 1438-1448 
%D DEC 1985
%K failure analysis, software reliability, system workload, VM/SP

%A Jospeh P. Cavano
%T Toward high confidence software
%J IEEE-TSE
%V SE-11
%N 12
%P 1449-1455 
%D DEC 1985
%K DOD applications, high confidence software, software reliability measurement
methodology 

%A Nozer D. Singpurwalla
%A Refik Soyer
%T Assessing (software) reliability growth using a random coefficient
autoregressive process and its ramifications 
%J IEEE-TSE
%V SE-11
%N 12
%P 1456-1464 
%D DEC 1985
%K dynamic linear and nonlinear models, Kalman filtering, likelihood ratios,
predictive distributions, prequential analysis, random coefficient 
autoregressive processes, reliability growth, software reliability

%A William S. Jewell
%T Bayesiam extensions to a basic model of software reliability
%J IEEE-TSE
%V SE-11
%N 12
%P 1465-1471 
%D DEC 1985
%K Bayesian analysis, program testing, software reliability

%A Sheldon M. Ross
%T Software reliability: the stopping rule problem
%J IEEE-TSE
%V SE-11
%N 12
%P 1472-1476 
%D DEC 1985
%K Failure rates, software reliability, stopping times

%A Debra J. Richardson
%A Lori A. Clarke
%T Partition analysis: a method combining testing and verification
%J IEEE-TSE
%V SE-11
%N 12
%P 1477-1490 
%D DEC 1985
%K software testing, software verification, symbolic evaluation

%A Algirdas Avizienis
%T The N-version approach to fault-tolerant software
%J IEEE-TSE
%V SE-11
%N 12
%P 1491-1501 
%D DEC 1985
%K design diversity, fault tolerance, multiple computation,
N-version programming, N-version software, software reliability, 
tolerance of design faults 

%A Tom Anderson
%A Peter A. Barrett
%A Dave N. Halliwell
%A Michael R. Moulding
%T Software fault tolerance: an evaluation
%J IEEE-TSE
%V SE-11
%N 12
%P 1502-1510 
%D DEC 1985
%K real-time systems, software fault tolerance, software reliability

%A Dave E. Eckhardt
%A Larry D. Lee
%T A theoretical basis for the analysis of multiversion software
subject to coincident errors 
%J IEEE-TSE
%V SE-11
%N 12
%P 1511-1517 
%D DEC 1985
%K coincident errors, fault-tolerant software, intensity distribution,
intensity of coincident errors, multiversion software, N-version programming, 
reliability of redundant software 

-- 
Jon Mauney,    mcnc!ncsu!mauney
North Carolina State University