[net.lsi] Auger spectroscopy of SiOx

fderavi@cybavax.UUCP (F. Deravi) (02/20/85)

	We are seeing some large peak displacements ( up to 20 volts )
of the Si and Si-O 92 and 76 volt peaks. Displacement is a function of
primary beam angle. Could this be sample charging?

Mike Cooke.

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